Neel Chatterjee, John Ortega, Inanc Meric, Peng Xiao, Ilan Tsameret. Machine Learning On Transistor Aging Data: Test Time Reduction and Modeling for Novel Devices. In IEEE International Reliability Physics Symposium, IRPS 2021, Monterey, CA, USA, March 21-25, 2021. pages 1-9, IEEE, 2021. [doi]
Abstract is missing.