Fail-safe I/O to control RESET# pin of DDR3 SDRAM and achieve ultra-low system power - researchr publication authors

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Rajat Chauhan, Prajkta Vyavahare, Siva Kothamasu. Fail-safe I/O to control RESET# pin of DDR3 SDRAM and achieve ultra-low system power. In Sixteenth International Symposium on Quality Electronic Design, ISQED 2015, Santa Clara, CA, USA, March 2-4, 2015. pages 357-360, IEEE, 2015. [doi]

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