Testing for Interconnect Crosstalk Defects Using On-Chip Embedded Processor Cores - researchr publication authors

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Li Chen, Xiaoliang Bai, Sujit Dey. Testing for Interconnect Crosstalk Defects Using On-Chip Embedded Processor Cores. In Proceedings of the 38th Design Automation Conference, DAC 2001, Las Vegas, NV, USA, June 18-22, 2001. pages 317-320, ACM, 2001. [doi]

This author has not been identified. Look up 'Li Chen' in GoogleThis author has not been identified. Look up 'Xiaoliang Bai' in GoogleThis author has not been identified. Look up 'Sujit Dey' in Google

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