Li Chen, Xiaoliang Bai, Sujit Dey. Testing for Interconnect Crosstalk Defects Using On-Chip Embedded Processor Cores. In Proceedings of the 38th Design Automation Conference, DAC 2001, Las Vegas, NV, USA, June 18-22, 2001. pages 317-320, ACM, 2001. [doi]
@inproceedings{ChenBD01,
title = {Testing for Interconnect Crosstalk Defects Using On-Chip Embedded Processor Cores},
author = {Li Chen and Xiaoliang Bai and Sujit Dey},
year = {2001},
url = {http://jamaica.ee.pitt.edu/Archives/ProceedingArchives/Dac/Dac2001/papers/2001/dac01/pdffiles/20_4.pdf},
tags = {testing},
researchr = {https://researchr.org/publication/ChenBD01},
cites = {0},
citedby = {0},
pages = {317-320},
booktitle = {Proceedings of the 38th Design Automation Conference, DAC 2001, Las Vegas, NV, USA, June 18-22, 2001},
publisher = {ACM},
isbn = {1-58113-297-2},
}