Test Chips With Scan-Based Logic Arrays

Yu-Hsiang Chen, Chia-Ming Hsu, Kuen-Jong Lee. Test Chips With Scan-Based Logic Arrays. IEEE Trans. on CAD of Integrated Circuits and Systems, 40(4):790-802, 2021. [doi]

Authors

Yu-Hsiang Chen

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Chia-Ming Hsu

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Kuen-Jong Lee

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