Reliability analysis and improvement for multi-level non-volatile memories with soft information - researchr publication authors

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Shih-Liang Chen, Bo-Ru Ke, Jian-Nan Chen, Chih-Tsun Huang. Reliability analysis and improvement for multi-level non-volatile memories with soft information. In Leon Stok, Nikil D. Dutt, Soha Hassoun, editors, Proceedings of the 48th Design Automation Conference, DAC 2011, San Diego, California, USA, June 5-10, 2011. pages 753-758, ACM, 2011. [doi]

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