Shih-Liang Chen, Bo-Ru Ke, Jian-Nan Chen, Chih-Tsun Huang. Reliability analysis and improvement for multi-level non-volatile memories with soft information. In Leon Stok, Nikil D. Dutt, Soha Hassoun, editors, Proceedings of the 48th Design Automation Conference, DAC 2011, San Diego, California, USA, June 5-10, 2011. pages 753-758, ACM, 2011. [doi]
@inproceedings{ChenKCH11,
title = {Reliability analysis and improvement for multi-level non-volatile memories with soft information},
author = {Shih-Liang Chen and Bo-Ru Ke and Jian-Nan Chen and Chih-Tsun Huang},
year = {2011},
doi = {10.1145/2024724.2024894},
url = {http://doi.acm.org/10.1145/2024724.2024894},
researchr = {https://researchr.org/publication/ChenKCH11},
cites = {0},
citedby = {0},
pages = {753-758},
booktitle = {Proceedings of the 48th Design Automation Conference, DAC 2011, San Diego, California, USA, June 5-10, 2011},
editor = {Leon Stok and Nikil D. Dutt and Soha Hassoun},
publisher = {ACM},
isbn = {978-1-4503-0636-2},
}