Virtual Circuit Model for Low Power Scan Testing in Linear Decompressor-Based Compression Environment - researchr publication authors

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Zhen Chen, Jia Li, Dong Xiang, Yu Huang. Virtual Circuit Model for Low Power Scan Testing in Linear Decompressor-Based Compression Environment. In Proceedings of the 20th IEEE Asian Test Symposium, ATS 2011, New Delhi, India, November 20-23, 2011. pages 96-101, IEEE Computer Society, 2011. [doi]

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