Zhen Chen, Jia Li, Dong Xiang, Yu Huang. Virtual Circuit Model for Low Power Scan Testing in Linear Decompressor-Based Compression Environment. In Proceedings of the 20th IEEE Asian Test Symposium, ATS 2011, New Delhi, India, November 20-23, 2011. pages 96-101, IEEE Computer Society, 2011. [doi]
@inproceedings{ChenLXH11,
title = {Virtual Circuit Model for Low Power Scan Testing in Linear Decompressor-Based Compression Environment},
author = {Zhen Chen and Jia Li and Dong Xiang and Yu Huang},
year = {2011},
doi = {10.1109/ATS.2011.62},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2011.62},
researchr = {https://researchr.org/publication/ChenLXH11},
cites = {0},
citedby = {0},
pages = {96-101},
booktitle = {Proceedings of the 20th IEEE Asian Test Symposium, ATS 2011, New Delhi, India, November 20-23, 2011},
publisher = {IEEE Computer Society},
isbn = {978-1-4577-1984-4},
}