Zhen Chen, Jia Li, Dong Xiang, Yu Huang. Virtual Circuit Model for Low Power Scan Testing in Linear Decompressor-Based Compression Environment. In Proceedings of the 20th IEEE Asian Test Symposium, ATS 2011, New Delhi, India, November 20-23, 2011. pages 96-101, IEEE Computer Society, 2011. [doi]
Abstract is missing.