Qikai Chen, Saibal Mukhopadhyay, Hamid Mahmoodi, Kaushik Roy. Process Variation Tolerant Online Current Monitor for Robust Systems. In 11th IEEE International On-Line Testing Symposium (IOLTS 2005), 6-8 July 2005, Saint Raphael, France. pages 171-176, IEEE Computer Society, 2005. [doi]
@inproceedings{ChenMMR05,
title = {Process Variation Tolerant Online Current Monitor for Robust Systems},
author = {Qikai Chen and Saibal Mukhopadhyay and Hamid Mahmoodi and Kaushik Roy},
year = {2005},
doi = {10.1109/IOLTS.2005.57},
url = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2005.57},
tags = {process monitoring},
researchr = {https://researchr.org/publication/ChenMMR05},
cites = {0},
citedby = {0},
pages = {171-176},
booktitle = {11th IEEE International On-Line Testing Symposium (IOLTS 2005), 6-8 July 2005, Saint Raphael, France},
publisher = {IEEE Computer Society},
isbn = {0-7695-2406-0},
}