Gang Chen, Janusz Rajski, Sudhakar M. Reddy, Irith Pomeranz. N-distinguishing Tests for Enhanced Defect Diagnosis. In Proceedings of the Eighteentgh Asian Test Symposium, ATS 2009, 23-26 November 2009, Taichung, Taiwan. pages 183-186, IEEE Computer Society, 2009. [doi]
Abstract is missing.