Deep H-GCN: Fast Analog IC Aging-Induced Degradation Estimation

Tinghuan Chen, Qi Sun, Canhui Zhan, Changze Liu, Huatao Yu, Bei Yu 0001. Deep H-GCN: Fast Analog IC Aging-Induced Degradation Estimation. IEEE Trans. on CAD of Integrated Circuits and Systems, 41(7):1990-2003, 2022. [doi]

Authors

Tinghuan Chen

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Qi Sun

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Canhui Zhan

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Changze Liu

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Huatao Yu

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Bei Yu 0001

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