Tinghuan Chen, Qi Sun, Canhui Zhan, Changze Liu, Huatao Yu, Bei Yu 0001. Deep H-GCN: Fast Analog IC Aging-Induced Degradation Estimation. IEEE Trans. on CAD of Integrated Circuits and Systems, 41(7):1990-2003, 2022. [doi]
@article{ChenSZLY022,
title = {Deep H-GCN: Fast Analog IC Aging-Induced Degradation Estimation},
author = {Tinghuan Chen and Qi Sun and Canhui Zhan and Changze Liu and Huatao Yu and Bei Yu 0001},
year = {2022},
doi = {10.1109/TCAD.2021.3107250},
url = {https://doi.org/10.1109/TCAD.2021.3107250},
researchr = {https://researchr.org/publication/ChenSZLY022},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {41},
number = {7},
pages = {1990-2003},
}