Fast Analytic Electromigration Analysis for General Multisegment Interconnect Wires

Liang Chen, Sheldon X.-D. Tan, Zeyu Sun, Shaoyi Peng, Min Tang, Junfa Mao. Fast Analytic Electromigration Analysis for General Multisegment Interconnect Wires. IEEE Trans. VLSI Syst., 28(2):421-432, 2020. [doi]

Authors

Liang Chen

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Sheldon X.-D. Tan

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Zeyu Sun

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Shaoyi Peng

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Min Tang

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Junfa Mao

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