A feedforward neural networks (FNN) used for semiconductor wafer fabrication parameters optimization

Yongmei Chen, Xiangdong Wang, Shoujue Wang, Linchu Shi. A feedforward neural networks (FNN) used for semiconductor wafer fabrication parameters optimization. In International Joint Conference Neural Networks, IJCNN 1999, Washington, DC, USA, July 10-16, 1999. pages 3922-3926, IEEE, 1999. [doi]

Abstract

Abstract is missing.