The impact of trapping centers on AlGaN/GaN resonant tunneling diode

Haoran Chen, Lin-An Yang, Xiaoxian Liu, Zhangming Zhu, Jun Luo, Yue Hao. The impact of trapping centers on AlGaN/GaN resonant tunneling diode. IEICE Electronic Express, 10(19):20130588, 2013. [doi]

Authors

Haoran Chen

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Lin-An Yang

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Xiaoxian Liu

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Zhangming Zhu

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Jun Luo

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Yue Hao

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