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Haoran Chen, Lin-An Yang, Xiaoxian Liu, Zhangming Zhu, Jun Luo, Yue Hao. The impact of trapping centers on AlGaN/GaN resonant tunneling diode. IEICE Electronic Express, 10(19):20130588, 2013. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Erratum: The impact of trapping centers on AlGaN/GaN resonant tunneling diode [IEICE Electronics Express Vol 10 (2013) No 19 pp 20130588]Haoran Chen, Lin-An Yang, Xiaoxian Liu, Zhangming Zhu, Jun Luo, Yue Hao. ieiceee, 10(24):20138002, 2013. [doi]
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