Haoran Chen, Lin-An Yang, Xiaoxian Liu, Zhangming Zhu, Jun Luo, Yue Hao. The impact of trapping centers on AlGaN/GaN resonant tunneling diode. IEICE Electronic Express, 10(19):20130588, 2013. [doi]
@article{ChenYLZLH13,
title = {The impact of trapping centers on AlGaN/GaN resonant tunneling diode},
author = {Haoran Chen and Lin-An Yang and Xiaoxian Liu and Zhangming Zhu and Jun Luo and Yue Hao},
year = {2013},
doi = {10.1587/elex.10.20130588},
url = {http://dx.doi.org/10.1587/elex.10.20130588},
researchr = {https://researchr.org/publication/ChenYLZLH13},
cites = {0},
citedby = {0},
journal = {IEICE Electronic Express},
volume = {10},
number = {19},
pages = {20130588},
}