Scan Test Bandwidth Management for Ultralarge-Scale System-on-Chip Architectures - researchr publication authors

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Wu-Tung Cheng, Yan Dong, Grady Gilles, Yu Huang, Jakub Janicki, Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer. Scan Test Bandwidth Management for Ultralarge-Scale System-on-Chip Architectures. IEEE Trans. VLSI Syst., 23(6):1050-1062, 2015. [doi]

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