Wu-Tung Cheng, Yan Dong, Grady Gilles, Yu Huang, Jakub Janicki, Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer. Scan Test Bandwidth Management for Ultralarge-Scale System-on-Chip Architectures. IEEE Trans. VLSI Syst., 23(6):1050-1062, 2015. [doi]
Abstract is missing.