Wu-Tung Cheng, Yan Dong, Grady Gilles, Yu Huang, Jakub Janicki, Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer. Scan Test Bandwidth Management for Ultralarge-Scale System-on-Chip Architectures. IEEE Trans. VLSI Syst., 23(6):1050-1062, 2015. [doi]
@article{ChengDGHJKMMRT15,
title = {Scan Test Bandwidth Management for Ultralarge-Scale System-on-Chip Architectures},
author = {Wu-Tung Cheng and Yan Dong and Grady Gilles and Yu Huang and Jakub Janicki and Mark Kassab and Grzegorz Mrugalski and Nilanjan Mukherjee and Janusz Rajski and Jerzy Tyszer},
year = {2015},
doi = {10.1109/TVLSI.2014.2332469},
url = {http://dx.doi.org/10.1109/TVLSI.2014.2332469},
researchr = {https://researchr.org/publication/ChengDGHJKMMRT15},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {23},
number = {6},
pages = {1050-1062},
}