On Trace Buffer Reuse-Based Trigger Generation in Post-Silicon Debug

Yun Cheng, Huawei Li, Ying Wang 0001, Haihua Shen, Bo Liu 0018, Xiaowei Li. On Trace Buffer Reuse-Based Trigger Generation in Post-Silicon Debug. IEEE Trans. on CAD of Integrated Circuits and Systems, 37(10):2166-2179, 2018. [doi]

Authors

Yun Cheng

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Huawei Li

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Ying Wang 0001

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Haihua Shen

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Bo Liu 0018

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Xiaowei Li

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