Yun Cheng, Huawei Li, Ying Wang 0001, Haihua Shen, Bo Liu 0018, Xiaowei Li. On Trace Buffer Reuse-Based Trigger Generation in Post-Silicon Debug. IEEE Trans. on CAD of Integrated Circuits and Systems, 37(10):2166-2179, 2018. [doi]
@article{ChengLWSLL18,
title = {On Trace Buffer Reuse-Based Trigger Generation in Post-Silicon Debug},
author = {Yun Cheng and Huawei Li and Ying Wang 0001 and Haihua Shen and Bo Liu 0018 and Xiaowei Li},
year = {2018},
doi = {10.1109/TCAD.2017.2778084},
url = {https://doi.org/10.1109/TCAD.2017.2778084},
researchr = {https://researchr.org/publication/ChengLWSLL18},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {37},
number = {10},
pages = {2166-2179},
}