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Yun Cheng, Huawei Li, Ying Wang 0001, Haihua Shen, Bo Liu 0018, Xiaowei Li. On Trace Buffer Reuse-Based Trigger Generation in Post-Silicon Debug. IEEE Trans. on CAD of Integrated Circuits and Systems, 37(10):2166-2179, 2018. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Cluster Restoration-Based Trace Signal Selection for Post-Silicon DebugYun Cheng, Huawei Li, Ying Wang 0001, Xiaowei Li 0001. tcad, 38(4):767-779, 2019. [doi] Flip-flop clustering based trace signal selection for post-silicon debugYun Cheng, Huawei Li, Ying Wang, Yingke Gao, Bo Liu, Xiaowei Li 0001. vts 2017: 1-6 [doi]
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