Te-Kuang Chiang, Ying-Wen Ko, Hong-Wun Gao, Yeong-Her Wang. A new short-channel-effect-degraded subthreshold behavior model for elliptical gate-all-around MOSFET. In Yajie Qin, Zhiliang Hong, Ting-Ao Tang, editors, 12th IEEE International Conference on ASIC, ASICON 2017, Guiyang, China, October 25-28, 2017. pages 520-524, IEEE, 2017. [doi]
@inproceedings{ChiangKGW17,
title = {A new short-channel-effect-degraded subthreshold behavior model for elliptical gate-all-around MOSFET},
author = {Te-Kuang Chiang and Ying-Wen Ko and Hong-Wun Gao and Yeong-Her Wang},
year = {2017},
doi = {10.1109/ASICON.2017.8252527},
url = {https://doi.org/10.1109/ASICON.2017.8252527},
researchr = {https://researchr.org/publication/ChiangKGW17},
cites = {0},
citedby = {0},
pages = {520-524},
booktitle = {12th IEEE International Conference on ASIC, ASICON 2017, Guiyang, China, October 25-28, 2017},
editor = {Yajie Qin and Zhiliang Hong and Ting-Ao Tang},
publisher = {IEEE},
isbn = {978-1-5090-6625-4},
}