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Field plate related reliability improvements in GaN-on-Si HEMTs

Alessandro Chini, F. Soci, Fausto Fantini, A. Nanni, A. Pantellini, Claudio Lanzieri, D. Bisi, Gaudenzio Meneghesso, Enrico Zanoni. Field plate related reliability improvements in GaN-on-Si HEMTs. Microelectronics Reliability, 52(9-10):2153-2158, 2012. [doi]

Authors

Alessandro Chini

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F. Soci

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Fausto Fantini

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A. Nanni

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A. Pantellini

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Claudio Lanzieri

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D. Bisi

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Gaudenzio Meneghesso

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Enrico Zanoni

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