Nonlinear Mixed Model and Reliability Prediction for OLED Luminance Degradation - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Kanghyun Choi, Jongwon Lee, Jongwoo Park. Nonlinear Mixed Model and Reliability Prediction for OLED Luminance Degradation. In IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019. pages 1-4, IEEE, 2019. [doi]

This author has not been identified. Look up 'Kanghyun Choi' in GoogleThis author has not been identified. Look up 'Jongwon Lee' in GoogleThis author has not been identified. Look up 'Jongwoo Park' in Google

runs on WebDSL