Kanghyun Choi, Jongwon Lee, Jongwoo Park. Nonlinear Mixed Model and Reliability Prediction for OLED Luminance Degradation. In IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019. pages 1-4, IEEE, 2019. [doi]
Abstract is missing.