Kanghyun Choi, Jongwon Lee, Jongwoo Park. Nonlinear Mixed Model and Reliability Prediction for OLED Luminance Degradation. In IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019. pages 1-4, IEEE, 2019. [doi]
@inproceedings{ChoiLP19-0,
title = {Nonlinear Mixed Model and Reliability Prediction for OLED Luminance Degradation},
author = {Kanghyun Choi and Jongwon Lee and Jongwoo Park},
year = {2019},
doi = {10.1109/IRPS.2019.8720437},
url = {https://doi.org/10.1109/IRPS.2019.8720437},
researchr = {https://researchr.org/publication/ChoiLP19-0},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019},
publisher = {IEEE},
isbn = {978-1-5386-9504-3},
}