A test circuit based on a ring oscillator array for statistical characterization of Plasma-Induced Damage - researchr publication authors

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Won Ho Choi, Saroj Satapathy, John Keane, Chris H. Kim. A test circuit based on a ring oscillator array for statistical characterization of Plasma-Induced Damage. In Proceedings of the IEEE 2014 Custom Integrated Circuits Conference, CICC 2014, San Jose, CA, USA, September 15-17, 2014. pages 1-4, IEEE, 2014. [doi]

This author has not been identified. Look up 'Won Ho Choi' in GoogleThis author has not been identified. Look up 'Saroj Satapathy' in GoogleThis author has not been identified. Look up 'John Keane' in GoogleThis author has not been identified. Look up 'Chris H. Kim' in Google

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