Won Ho Choi, Saroj Satapathy, John Keane, Chris H. Kim. A test circuit based on a ring oscillator array for statistical characterization of Plasma-Induced Damage. In Proceedings of the IEEE 2014 Custom Integrated Circuits Conference, CICC 2014, San Jose, CA, USA, September 15-17, 2014. pages 1-4, IEEE, 2014. [doi]
@inproceedings{ChoiSKK14-1,
title = {A test circuit based on a ring oscillator array for statistical characterization of Plasma-Induced Damage},
author = {Won Ho Choi and Saroj Satapathy and John Keane and Chris H. Kim},
year = {2014},
doi = {10.1109/CICC.2014.6945996},
url = {http://dx.doi.org/10.1109/CICC.2014.6945996},
researchr = {https://researchr.org/publication/ChoiSKK14-1},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {Proceedings of the IEEE 2014 Custom Integrated Circuits Conference, CICC 2014, San Jose, CA, USA, September 15-17, 2014},
publisher = {IEEE},
}