Jun-Ho Choy, Valeriy Sukharev, Armen Kteyan, Henrik Hovsepyan, Ramnath Venkatraman, Ruggero Castagnetti. Post placement leakage reduction with stress-enhanced filler cells. In IEEE/ACM International Symposium on Low Power Electronics and Design, ISLPED 2015, Rome, Italy, July 22-24, 2015. pages 303-308, IEEE, 2015. [doi]
Abstract is missing.