Compact and low-loss ESD protection design for V-band RF applications in a 65-nm CMOS technology - researchr publication authors

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Li-Wei Chu, Chun-Yu Lin, Shiang-Yu Tsai, Ming-Dou Ker, Ming-Hsiang Song, Chewnpu Jou, Tse-Hua Lu, Jeng-Chou Tseng, Ming-Hsien Tsai, Tsun-Lai Hsu, Ping-Fang Hung, Tzu-Heng Chang. Compact and low-loss ESD protection design for V-band RF applications in a 65-nm CMOS technology. In 2012 IEEE International Symposium on Circuits and Systems, ISCAS 2012, Seoul, Korea (South), May 20-23, 2012. pages 2127-2130, IEEE, 2012. [doi]

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