Li-Wei Chu, Chun-Yu Lin, Shiang-Yu Tsai, Ming-Dou Ker, Ming-Hsiang Song, Chewnpu Jou, Tse-Hua Lu, Jeng-Chou Tseng, Ming-Hsien Tsai, Tsun-Lai Hsu, Ping-Fang Hung, Tzu-Heng Chang. Compact and low-loss ESD protection design for V-band RF applications in a 65-nm CMOS technology. In 2012 IEEE International Symposium on Circuits and Systems, ISCAS 2012, Seoul, Korea (South), May 20-23, 2012. pages 2127-2130, IEEE, 2012. [doi]
@inproceedings{ChuLTKSJLTTHHC12,
title = {Compact and low-loss ESD protection design for V-band RF applications in a 65-nm CMOS technology},
author = {Li-Wei Chu and Chun-Yu Lin and Shiang-Yu Tsai and Ming-Dou Ker and Ming-Hsiang Song and Chewnpu Jou and Tse-Hua Lu and Jeng-Chou Tseng and Ming-Hsien Tsai and Tsun-Lai Hsu and Ping-Fang Hung and Tzu-Heng Chang},
year = {2012},
doi = {10.1109/ISCAS.2012.6271706},
url = {http://dx.doi.org/10.1109/ISCAS.2012.6271706},
researchr = {https://researchr.org/publication/ChuLTKSJLTTHHC12},
cites = {0},
citedby = {0},
pages = {2127-2130},
booktitle = {2012 IEEE International Symposium on Circuits and Systems, ISCAS 2012, Seoul, Korea (South), May 20-23, 2012},
publisher = {IEEE},
isbn = {978-1-4673-0218-0},
}