A multi-bit/cell PUF using analog breakdown positions in CMOS - researchr publication authors

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Kai-Hsin Chuang, Erik Bury, Robin Degraeve, Ben Kaczer, T. Kallstenius, Guido Groeseneken, Dimitri Linten, Ingrid Verbauwhede. A multi-bit/cell PUF using analog breakdown positions in CMOS. In IEEE International Reliability Physics Symposium, IRPS 2018, Burlingame, CA, USA, March 11-15, 2018. pages 2-1, IEEE, 2018. [doi]

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