Kai-Hsin Chuang, Erik Bury, Robin Degraeve, Ben Kaczer, T. Kallstenius, Guido Groeseneken, Dimitri Linten, Ingrid Verbauwhede. A multi-bit/cell PUF using analog breakdown positions in CMOS. In IEEE International Reliability Physics Symposium, IRPS 2018, Burlingame, CA, USA, March 11-15, 2018. pages 2-1, IEEE, 2018. [doi]
@inproceedings{ChuangBDKKGLV18,
title = {A multi-bit/cell PUF using analog breakdown positions in CMOS},
author = {Kai-Hsin Chuang and Erik Bury and Robin Degraeve and Ben Kaczer and T. Kallstenius and Guido Groeseneken and Dimitri Linten and Ingrid Verbauwhede},
year = {2018},
doi = {10.1109/IRPS.2018.8353655},
url = {https://doi.org/10.1109/IRPS.2018.8353655},
researchr = {https://researchr.org/publication/ChuangBDKKGLV18},
cites = {0},
citedby = {0},
pages = {2},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2018, Burlingame, CA, USA, March 11-15, 2018},
publisher = {IEEE},
isbn = {978-1-5386-5479-8},
}