Chen-I Chung, Shuo-Wen Chang, Ching-Hwa Cheng. Fine resolution double edge clipping with calibration technique for built-in at-speed delay testing. In Gordon W. Roberts, Bill Eklow, editors, 2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009. pages 1, IEEE, 2009. [doi]
@inproceedings{ChungCC09-2,
title = {Fine resolution double edge clipping with calibration technique for built-in at-speed delay testing},
author = {Chen-I Chung and Shuo-Wen Chang and Ching-Hwa Cheng},
year = {2009},
doi = {10.1109/TEST.2009.5355907},
url = {http://dx.doi.org/10.1109/TEST.2009.5355907},
researchr = {https://researchr.org/publication/ChungCC09-2},
cites = {0},
citedby = {0},
pages = {1},
booktitle = {2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009},
editor = {Gordon W. Roberts and Bill Eklow},
publisher = {IEEE},
isbn = {978-1-4244-4868-5},
}