Woohyun Chung, Seongbo Shim, Youngsoo Shin. Redundant via insertion in directed self-assembly lithography. In Luca Fanucci, Jürgen Teich, editors, 2016 Design, Automation & Test in Europe Conference & Exhibition, DATE 2016, Dresden, Germany, March 14-18, 2016. pages 55-60, IEEE, 2016. [doi]
@inproceedings{ChungSS16,
title = {Redundant via insertion in directed self-assembly lithography},
author = {Woohyun Chung and Seongbo Shim and Youngsoo Shin},
year = {2016},
url = {http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=7459280},
researchr = {https://researchr.org/publication/ChungSS16},
cites = {0},
citedby = {0},
pages = {55-60},
booktitle = {2016 Design, Automation & Test in Europe Conference & Exhibition, DATE 2016, Dresden, Germany, March 14-18, 2016},
editor = {Luca Fanucci and Jürgen Teich},
publisher = {IEEE},
isbn = {978-3-9815-3707-9},
}