Woohyun Chung, Seongbo Shim, Youngsoo Shin. Redundant via insertion in directed self-assembly lithography. In Luca Fanucci, Jürgen Teich, editors, 2016 Design, Automation & Test in Europe Conference & Exhibition, DATE 2016, Dresden, Germany, March 14-18, 2016. pages 55-60, IEEE, 2016. [doi]
Abstract is missing.