Hot topic session 12B: Stay relevant with standards-based DFT

C. J. Clark, Víctor H. Champac. Hot topic session 12B: Stay relevant with standards-based DFT. In IEEE 32nd VLSI Test Symposium, VTS 2014, Napa, CA, USA, April 13-17, 2014. pages 1, IEEE, 2014. [doi]

Authors

C. J. Clark

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Víctor H. Champac

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