C. J. Clark, Víctor H. Champac. Hot topic session 12B: Stay relevant with standards-based DFT. In IEEE 32nd VLSI Test Symposium, VTS 2014, Napa, CA, USA, April 13-17, 2014. pages 1, IEEE, 2014. [doi]
@inproceedings{ClarkC14,
title = {Hot topic session 12B: Stay relevant with standards-based DFT},
author = {C. J. Clark and Víctor H. Champac},
year = {2014},
doi = {10.1109/VTS.2014.6818802},
url = {http://dx.doi.org/10.1109/VTS.2014.6818802},
researchr = {https://researchr.org/publication/ClarkC14},
cites = {0},
citedby = {0},
pages = {1},
booktitle = {IEEE 32nd VLSI Test Symposium, VTS 2014, Napa, CA, USA, April 13-17, 2014},
publisher = {IEEE},
}