Analysis of zero-temperature coefficient behavior on vertically stacked double nanosheet nMOS devices

Carlos H. S. Coelho, João Antonio Martino, Marcello Bellodi, Eddy Simoen, Anabela Veloso, Paula Ghedini Der Agopian. Analysis of zero-temperature coefficient behavior on vertically stacked double nanosheet nMOS devices. Microelectronics Journal, 117:105277, 2021. [doi]

Abstract

Abstract is missing.