Resilience, Production Yield and Self-Configuration in the Future Massively Defective Nanochips - researchr publication authors

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Jacques Henri Collet, Piotr Zajac. Resilience, Production Yield and Self-Configuration in the Future Massively Defective Nanochips. In 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 8-11 July 2007, Heraklion, Crete, Greece. pages 259, IEEE Computer Society, 2007. [doi]

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