Jacques Henri Collet, Piotr Zajac. Resilience, Production Yield and Self-Configuration in the Future Massively Defective Nanochips. In 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 8-11 July 2007, Heraklion, Crete, Greece. pages 259, IEEE Computer Society, 2007. [doi]
Abstract is missing.