Jacques Henri Collet, Piotr Zajac. Resilience, Production Yield and Self-Configuration in the Future Massively Defective Nanochips. In 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 8-11 July 2007, Heraklion, Crete, Greece. pages 259, IEEE Computer Society, 2007. [doi]
@inproceedings{ColletZ07,
title = {Resilience, Production Yield and Self-Configuration in the Future Massively Defective Nanochips},
author = {Jacques Henri Collet and Piotr Zajac},
year = {2007},
doi = {10.1109/IOLTS.2007.56},
url = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2007.56},
researchr = {https://researchr.org/publication/ColletZ07},
cites = {0},
citedby = {0},
pages = {259},
booktitle = {13th IEEE International On-Line Testing Symposium (IOLTS 2007), 8-11 July 2007, Heraklion, Crete, Greece},
publisher = {IEEE Computer Society},
}