Reliability Based Hardware Trojan Design Using Physics-Based Electromigration Models - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Chase Cook, Sheriff Sadiqbatcha, Zeyu Sun, Sheldon X.-D. Tan. Reliability Based Hardware Trojan Design Using Physics-Based Electromigration Models. In 15th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, SMACD 2018, Prague, Czech Republic, July 2-5, 2018. pages 5-8, IEEE, 2018. [doi]

This author has not been identified. Look up 'Chase Cook' in GoogleThis author has not been identified. Look up 'Sheriff Sadiqbatcha' in GoogleThis author has not been identified. Look up 'Zeyu Sun' in GoogleThis author has not been identified. Look up 'Sheldon X.-D. Tan' in Google

runs on WebDSL