Chase Cook, Sheriff Sadiqbatcha, Zeyu Sun, Sheldon X.-D. Tan. Reliability Based Hardware Trojan Design Using Physics-Based Electromigration Models. In 15th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, SMACD 2018, Prague, Czech Republic, July 2-5, 2018. pages 5-8, IEEE, 2018. [doi]
@inproceedings{CookSST18,
title = {Reliability Based Hardware Trojan Design Using Physics-Based Electromigration Models},
author = {Chase Cook and Sheriff Sadiqbatcha and Zeyu Sun and Sheldon X.-D. Tan},
year = {2018},
doi = {10.1109/SMACD.2018.8434890},
url = {https://doi.org/10.1109/SMACD.2018.8434890},
researchr = {https://researchr.org/publication/CookSST18},
cites = {0},
citedby = {0},
pages = {5-8},
booktitle = {15th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, SMACD 2018, Prague, Czech Republic, July 2-5, 2018},
publisher = {IEEE},
isbn = {978-1-5386-5153-7},
}