Chase Cook, Sheriff Sadiqbatcha, Zeyu Sun, Sheldon X.-D. Tan. Reliability Based Hardware Trojan Design Using Physics-Based Electromigration Models. In 15th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, SMACD 2018, Prague, Czech Republic, July 2-5, 2018. pages 5-8, IEEE, 2018. [doi]
Abstract is missing.