Kris Croes, Veerle Simons, Sofie Beyne, Vladimir Cherman, Herman Oprins, Michele Stucchi, Ph. Absil, A. Glabman, Eric Wilcox. Understanding EM-Degradation Mechanisms in Metal Heaters Used for Si Photonics Applications. In IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019. pages 1-4, IEEE, 2019. [doi]
@inproceedings{CroesSBCOSAGW19, title = {Understanding EM-Degradation Mechanisms in Metal Heaters Used for Si Photonics Applications}, author = {Kris Croes and Veerle Simons and Sofie Beyne and Vladimir Cherman and Herman Oprins and Michele Stucchi and Ph. Absil and A. Glabman and Eric Wilcox}, year = {2019}, doi = {10.1109/IRPS.2019.8720604}, url = {https://doi.org/10.1109/IRPS.2019.8720604}, researchr = {https://researchr.org/publication/CroesSBCOSAGW19}, cites = {0}, citedby = {0}, pages = {1-4}, booktitle = {IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019}, publisher = {IEEE}, isbn = {978-1-5386-9504-3}, }